材料的表征
![XPS](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_image_content/image.img.jpg/1690553526163.jpg)
The 材料的表征 Core facility is located in Room 006 of 245 Beacon Street on the main campus of 电子游戏软件. 该设施支持多种表征需求, 包括表面分析, 光学分析, 热分析, 结构/相分析, 粒度分析, 吸收分析, 等等....... 作为一个新的核心设施, we are also expecting to further develop the functions according to the users' needs.
![MCC分析图表](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_padded_section/par/bc_image_content_ext.coreimg.jpeg/1710183077834/mcc-analysis-chart-spring-2024.jpeg)
![力量D2](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-0/bc_image_content/image.img.jpg/1690553526105.jpg)
布鲁克D2相射粉末x射线衍射仪
结构分析
相分析
This benchtop device is used for quantitative phase analysis and crystal structure identification of a crystalline material. Nano-structure and crystallite size can be determined through small-angle x-ray scattering (SAXS) analysis.
![XPS](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-1/bc_image_content/image.img.jpg/1690553529133.jpg)
ThermoFisher K-Alpha x射线光电子能谱(XPS)
表面分析
The K-Alpha Spectrometer delivers much improved spectroscopic performance. 这种飞跃的结果是更快的分析时间, 改进的元素检测, and the possibility to acquire data at higher 决议 yielding better chemical state identification.
Analytical options include a vacuum transfer module for moving air-sensitive samples from a glove box to the system, 倾斜模块用于ARXPS数据采集. 配备Thermo Scientific™优势数据系统, 完整的表面分析软件系统, the K-Alpha has a range of software features designed to optimize data interpretation, 数据报告和可用性. The K-Alpha XPS system meets the requirements of both experienced XPS analysts and newcomers to the technique, 汇集高性能, 单色XPS和溅射深度分析, 具有智能自动化和直观控制.
![AFM](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-2/bc_image_content/image.img.jpg/1690553526272.jpg)
Park XE70原子力显微镜(AFM) 又名扫描力显微镜(SFM)
表面分析
It commonly provides ultra high 决议 topographical surface characterization. The image is obtained by the tip tapping on the surface of the sample. 因此, 它也可用来电子游戏正规平台电学, 磁, 以及表面的机械性能.
![Horiba](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-3/bc_image_content/image.img.jpg/1690553526165.jpg)
堀场微XploRA拉曼光谱仪
光学分析
结构分析
It is a non-destructive fingerprint chemical analysis technique which provides detailed information about chemical structure, 相位与多态性, 内在应力/应变, 结晶度和分子相互作用. The measurement is based upon the interaction of light with the chemical bonds within a material.
![力量顶点](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-4/bc_image_content/image.img.jpg/1690553526121.jpg)
力量顶点 80v Fourier-Transform Infrared spectroscopy (FTIR)
光学分析
吸收分析
结构分析
IR spectroscopy is based in the fact that molecules absorb specific frequencies that are characteristic of their structure. 这些吸收与键的强度有关. 由于傅里叶变换的改进, FTIR turns into instant selective tool for a fingerprint of the substance. The ATR accessory is prepared for non-image measurements, which is very user friendly.
![Micromeritics AutoChem II 2920化学吸附分析仪](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-5/bc_image_content_ext.coreimg.jpeg/1705285383301/micromeritics-autochem.jpeg)
Micromeritics AutoChem II 2920化学吸附分析仪
表面分析
吸收分析
化学吸附用于显影, monitoring and measuring of corrosion inhibitors and is used for measuring surface active sites on a substrate. During the process the adsorbing gas or vapor molecule splits into atoms, 激进分子, 与吸附部位形成化学键的离子. 将附上质谱仪进行现场分析.
典型应用:
燃料电池/催化重整:
- 金属表面积
- 金属分散
- 平均晶粒尺寸
部分氧化:
- 程序升温氧化(TPO)
- 程序升温解吸(一系列问题)
- 氧的解吸热
- 氧的解离热
催化裂化:
- 氨化学吸收作用
- 氨的一系列问题
- 烷基胺的一系列问题
- 芳香胺的一系列问题
异构化/加氢裂化/费托合成:
- 程序升温还原(TPR)
- 脉冲化学吸收作用
- 一系列问题
![NETZSCH差示扫描量热计(DSC) 214 Polyma](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-6/bc_image_content/image.img.jpg/1690553526364.jpg)
NETZSCH差示扫描量热计(DSC) 214 Polyma
热分析
相分析
它精确地测量热容, phase transition and oxidative stability of 聚合物 or liquid crystals, which allows us to understand amorphous and crystalline behavior, 多晶和共晶转变, 固化和固化程度, 以及许多其他的材料特性. This device can heat at up to 500 K/min and cool at 200 K/min over a wide measurement range.
![NETZSCH Simultaneous 热分析 (STA) 449 F1 Jupiter / Quadrupole Mass Spectrometer (QMS) 403](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-7/bc_image_content/image.img.jpg/1690553526101.jpg)
NETZSCH Simultaneous 热分析 (STA) 449 F1 Jupiter / Quadrupole Mass Spectrometer (QMS) 403
热分析
相分析
STA refers to the simultaneous application of Thermogravimetry (TGA) and DSC to one and the same sample in a single instrument. The tungsten heating element allows for measurements under helium atmosphere from room temperature to 2000°C and high-vacuum measurements from 400°C to 2000°C. QMS耦合用于演化气体分析.
![发现动态机械分析仪(DMA) 850](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-8/bc_image_content/image.img.jpg/1690553526420.jpg)
发现动态机械分析仪(DMA) 850
热分析
粒度分析
相分析
It is used to measure a material’s response (deformation) to a sinusoidal load under a given temperature and/or time. 常见的物理性质是玻璃化转变, 固体样品的弹性和粘度.
![Agilent Cary 60 UV/VIS光谱仪(UV- VIS)](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-9/bc_image_content_cop/image.img.jpg/1678201546006.jpg)
Agilent Cary 60 UV/VIS光谱仪(UV- VIS)
光学分析
结构分析
The Cary 60 UV-Vis spectrophotometer has a wavelength range of 190–1100 nm that can be scanned in under three seconds. Our flexible UV-Vis spectrophotometer can be fitted with long path length cuvettes and solid sample transmission accessories. It is ideal for remote UV-Vis absorbance analysis when equipped with fiber optic probes. 样品附件包括一个试管溶液样品支架, 固体样品传输支架和光纤探头.
![打赌](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-10/bc_image_content_ext.coreimg.jpeg/1690553526100/asap-2020-5.jpeg)
Micromeritics ASAP 2020 plus物理吸收分析仪(打赌)
表面分析
吸收分析
The ASAP 2020 Plus is a high-performance adsorption analyzer for measuring surface area, 孔隙大小, 以及粉末和多孔材料的孔隙体积. Standard methods or user-customized protocols can be used to characterize adsorbents, 催化剂, 沸石, 财政部, api, 赋形剂, 以及各种多孔和非多孔材料. The ASAP 2020 Plus is ideally suited for gas adsorption analysis of microporous (0.35 to 2nm) and mesoporous (2 to 50nm) materials and delivers superior accuracy, 决议, 数据简化. A vapor sorption option can be added to the ASAP 2020 Plus to extend the analysis range of the ASAP 2020 Plus physisorption.
![DLS 700](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/par/bc_accordion_content/tab-11/bc_image_content_ext.coreimg.jpeg/1710180673630/anton-parr-particle-analyzer-litesizer-dls-700.jpeg)
Anton-Parr Particle Analyzer Litesizer Dynamic Light Scattering (DLS) 700
粒子分析
The Litesizer DLS 700 is a light-scattering instrument for characterizing particles in liquid dispersions. 它测量颗粒大小, 粒子浓度, 电动电势, 电泳迁移率, 分子质量, 和透光率. It can determine 粒子浓度 based on single-angle DLS or multi-angle particle sizing (MAPS), and measures transmittance continuously - providing a direct measure of turbidity - and allows automatic adjustment of parameters, e.g. 聚焦,衰减,测量角度,测量持续时间.
粒径范围:直径0.3 nm ~ 10 μm
Zeta potential range > ± 1000 mV (3.8 nm-100 μm)
分子质量范围:300da - 20mda
![京金](/content/bc-web/research/sites/vice-provost-for-research/about/research-facilities/materials-characterization/_jcr_content/bottompar/bc_padded_section_0_/par/bc_padded_section/par/responsive_columns_0/col1/bc_image_content/image.img.jpg/1636046962344.jpg)
金晶,博士.D.
导演
Dr. 京金 is a materials scientist who is primarily focused on 磁 nano-materials systems (1D & 2D). She initially joined 电子游戏软件 as the Assistant 导演 of 核磁共振 Center after completing her Ph.D. from the Institute of Materials Science at the University of Connecticut in May 2017 in particular to oversee EPR-related projects. 在此之前,Jing获得了B.S. 应用物理学位和硕士学位.英格. degree in Material Physics and Chemistry from Tianjin University in China, and M.S. 在美国克拉克大学获得物理学学位. 她目前正在努力获得硕士学位.B.我是不列颠哥伦比亚省卡罗尔管理学院的硕士, and has recently been appointed the director of the new BC 材料的表征 Core.
Dr. Jin has intensive hands-on experience with many different characterization techniques, including EPR & 核磁共振,以及XPS, XRD, AFM, FTIR,拉曼,表面吸收. She has led/collaborated on work characterizing the properties of many different systems encompassing organic and inorganic materials, 聚合物, 和生物分子.
金晶,博士.D. |导演
电子游戏软件材料表征中心
毕肯街245号,办公室505D /实验室B06
Chestnut Hill, MA 02467-3860
办公室电话:(617)552-4766
实验室电话:(617)552-0873
电子邮件: 京.jin@cmithlj.com